Conductive film dual electric measurement four probe tester

NegotiableUpdate on 05/26

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Conductive film dual electric measurement four probe tester

Product Details

Scope of application: Widely used:

Silicon block, chip resistivity and diffusion layer, epitaxial layer, ITO conductive foil film, conductive rubber and other materials block resistance semiconductor materials/wafers, solar cells, electronic components, conductive thin films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films,

Thin layer resistance and resistivity of EMI coatings and other substances, conductive paints, conductive pastes, conductive plastics, conductive rubber, conductive films, metal films, etc,

Antistatic materials, EMI protective materials, conductive fibers, conductive ceramics, etc

Conductive film dual electric measurement four probe tester

Function Description:

1. Four probe combination double electric measurement method

2. LCD display, automatic measurement, automatic range, automatic coefficient compensation

3. Integrated circuit system, constant current output

4. Optional: PC software for data management and processing

5. Provide two language operation interface options: Chinese or English

Conductive film dual electric measurement four probe tester

Reference standard:

1. The standard for measuring the resistivity of silicon wafers (ASTM F84)

2. GB/T 1551-2009 "Method for determination of resistivity of silicon single crystals"

3. GB/T 1551-1995 "Determination of resistivity of silicon and germanium single crystals using direct current two probe method"

4. GB/T 1552-1995 "Determination of resistivity of silicon and germanium single crystals by direct current four probe method"

Conductive film dual electric measurement four probe tester

Dual electric combination testing method:

Using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed by double electrical measurement to solve the influence of sample geometric dimensions, boundary effects, probe misalignment, and mechanical drift on the measurement results. It is suitable for testing micro areas with oblique four probes.

Specification/Model	FT-341	FT-342	FT-343	FT-345	FT-346	FT-347
1. Sheet resistance of block resistors	10-5～2×105Ω/□	10-4～2×105Ω/□	10-3～2×105Ω/□	10-3～2×104Ω /□	10-2～2×105Ω/□	10-2～2×104Ω/□
2. Resistance	10-6～2×106Ω-cm	10-5～2×106Ω-cm	10-4～2×106Ω-cm	10-4～2×105Ω-cm	10-3～2×106Ω-cm	10-3～2×106Ω-cm
3. Test current	0.1μA.μA.0μA，100µA，1mA，10mA，100mA	1μA，10μA，100µA，1mA，10mA，100mA	0.1μA.μA，10μA，100µA，1mA，10mA，100 mA	1μA，10μA，100µA，1mA，10mA，100mA	0.1 μ A, 1 μ A, 10 μ A, 100 µ A, 1mA, 10mA, 100mA	1μA，10μA，100µA，1mA，10mA，100mA
4. Current accuracy	±0.1% accuracy	±0.2% accuracy	±0.2% accuracy	±0.3% accuracy	±0.3% accuracy	±0.3% accuracy
5. Resistance accuracy	≤0.3% accuracy	≤0.3% accuracy	≤0.3% accuracy	≤0.5% accuracy	≤0.5% accuracy	≤0.5% accuracy
6. Display the reading	Large screen LCD: Resistance, Square Resistance, Temperature, Unit Conversion, Temperature Coefficient, Current, Voltage, Probe Shape, Probe Spacing, Thickness, Conductivity
temperature. unit conversion.temperature coefficient. current. voltage. probe	shape. probe spacing. thickness. conductivity
7. Testing method	Double electrical measurement in test mode
8. Power Supply	Input: AC 220V ± 10%. 50Hz Power consumption:<30W
9. Errors	≤ 3% (standard sample result)
10. Choose to buy function	Choose 1. PC software; Choose 2. Square probe; Choose 3. Linear probe; Purchase 4. Testing Platform; 5. Standard resistor. 1pc software; two square probe;