Dual electric combination four probe tester

Dual electric combination four probe tester

One Principle of dual electric combination four probe needle method:

1. By using the four probe dual position combination measurement technology, the van der Waals measurement method is applied to the linear four probe. By using a combination of current and voltage probes for two electrical measurements, the final calculation results can automatically eliminate the adverse effects caused by factors such as sample geometry, boundary effects, probe misalignment, and mechanical drift on the measurement results.

During the testing process, factors such as probe spacing, sample size, and probe position on the sample surface may not be considered, provided that basic conditions are met.

3. Automatic correction reduces its impact on test results, thereby improving the accuracy of measurement results.

II Advantages of the dual electric combination four probe method:

1. The conventional four probe measurement method cannot solve the automatic correction of geometric boundary conditions and probe spacing

2. Applied to various shapes of thin films and sheet-like semiconductor materials.