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FT-332 ordinary block resistance tester

NegotiableUpdate on 05/26
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Overview

FT-332 ordinary block resistance tester

Product Details

FT-332 ordinary block resistance tester

Reference standard:

1. The standard for measuring the resistivity of silicon wafers (ASTM F84)

2. GB/T 1551-2009 "Method for determination of resistivity of silicon single crystals"

3. GB/T 1551-1995 "Determination of resistivity of silicon and germanium single crystals using direct current two probe method"

4. GB/T 1552-1995 "Determination of resistivity of silicon and germanium single crystals by direct current four probe method"

Dual electric combination testing method:


Using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed by double electrical measurement to solve the influence of sample geometric dimensions, boundary effects, probe misalignment, and mechanical drift on the measurement results. It is suitable for testing micro areas with oblique four probes.





Specification type

FT-332

1. Range of block resistance

10-4~2×105Ω/□

2. Range of resistivity

10-5~2×106Ω-cm

Test current range

10μA,100µA,1mA,10mA,100mA

4. Current accuracy

±0.2%

5. Resistance accuracy

≤0.3%

6. Display reading

LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity

7. Testing method

Ordinary single electrical measurement

8. Working power supply

Input: AC 220V ± 10%. 50Hz Power consumption:<30W

9. Error

≤ 4% (standard sample result)

10. Selection function

Choose 1. PC software; Choose 2. Square probe; Choose 3. Linear probe; Purchase 4. Testing Platform; 5. Standard resistance

11. Test probe

Probe spacing selection: 1mm; 2mm; Three specifications of 3mm; Probe material selection: tungsten carbide needle; White steel needle; Gold plated phosphor copper hemispherical needle