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Thermal conductivity analyzer (LFA 467 HyperFlash)

NegotiableUpdate on 02/13
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Overview
Without the need to replace detectors or furnace bodies, the LFA467 HyperFlash can achieve a wide temperature range of -100 ℃ to 500 ℃ on the same instrument. In addition to a wide range of optional accessories, it has created a Xintiandi of thermophysical property measurement.
Product Details

1、 Product Introduction:

Wide temperature range, from -100 arrive 500

Without the need to replace detectors or furnace bodies, the LFA467 HyperFlash can achieve a wide temperature range of -100 ℃ to 500 ℃ on the same instrument. In addition to a wide range of optional accessories, it has created a Xintiandi of thermophysical property measurement.

The sampler is attached 16 Sample grade, sample capacity is the same as before 4 times

LFA 467 HyperFlashOne major advantage is that it can be continuously measured across the entire temperature range 16 A sample greatly reduces the measurement time. The liquid nitrogen supply system can automatically replenish liquid nitrogen to the detector and furnace body, ensuring uninterrupted measurement of the instrument around the clock.

ZoomOpticsThe measurement results obtained are more accurate, reducing measurement errors

technicalZoomOpticsOptimized the detection range of the detector, thereby eliminating the influence of aperture stop. Significantly increased the accuracy of measurement results.

Extremely high sampling frequency(2MHz)Especially suitable for thin film samples

Thin film samples and high thermal conductivity materials require a fast data acquisition rate to accurately record the temperature rise process on the surface of the sample.LFA 467 HyperFlashCan provide2MHzThe data collection rate isLFAThe system *.

2、 Technical parameters:

Temperature range: -100 ° C... 500 ° C, single furnace body
Non contact measurement, IR detector detects the temperature rise process on the surface of the sample
Data acquisition rate: up to 2MHz (including half temperature signal detection and pulse mapping technology) - for high thermal conductivity and thin film samples, the sampling time (about 10 times the half temperature time) can be as low as 1ms, and the sample thickness can be as thin as 0.01 mm or less (depending on the specific thermal conductivity)
Measurement range of thermal diffusivity coefficient: 0.01 mm2/s... 2000 mm2/s
Thermal conductivity measurement range:<0.1 W/(mK)... 4000 W/(mK)
Sample size:
-Diameter 6 mm... 25.4 mm (including square samples)
-Thickness 0.01 mm... 6 mm (the thickness requirement of the sample depends on the thermal conductivity of different samples)
Automatic sampler for 16 sample grades
More than 20 types of brackets
Rich measurement modes, suitable for various types of samples. Such as anisotropic materials, multi-layer mode analysis, thin films, fibers, liquids, pastes, powders, molten metals, testing under pressure, and so on.
Zoom Optics optimizes the detection range of the detector (patented technology)
The patented pulse mapping technology (US 7038209, US 20040079886, DE 10242741- approximation of the pulse) is used for pulse width correction, which can improve the measurement accuracy of specific heat value
Atmosphere: Inert, oxidizing, static/dynamic, negative pressure
Follow the following standards: ASTM E1461, ASTM E2585, DIN EN 821-2, DIN 30905, ISO 22007-4, ISO 18755, ISO 13826; DIN EN 1159-2, Wait

3、 ZoomOptics obtains more accurate measurement results and reduces measurement errors
For traditional LFA system designs, the detection area covered by the detector is usually adjusted to fit the maximum size of the sample (25.4mm). For samples with smaller diameters, a light shielding film or mask is usually added on top of the sample to cover the peripheral area as much as possible. However, since any object emits infrared radiation, and shading or masking materials are no exception, the detector signal obtained from this will inevitably be affected. The degree of this influence is related to the difference in thermal diffusion coefficients between the sample and the mask material. As a result, for some samples, the tail of the temperature rise curve measured by the detector may continue to rise or reach a horizontal state prematurely. In either case, it will cause a deviation in the half heating time obtained from the analysis, resulting in errors in the calculated thermal diffusion coefficient.
By using the ZoomOptics (patent number: DE 10 2012 106 955 B4 2014.04.03) accessory equipped with LFA467, the detection range of the detector can be adjusted more flexibly, ensuring that the detector only detects the temperature rise process on the surface of the sample, without the need for additional masks, and the surrounding environmental signals have no impact. The preset detection diameter ratio is 70%, suitable for most applications, and the software allows operators to freely adjust this value to suit specific sample sizes and applications.