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Flash method thermal conductivity meter LFA 467

NegotiableUpdate on 02/12
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Overview

LFA467HTHyperFlash ®- Flash Thermal Conductivity Meter (RT)

Product Details

LFA 467 HT HyperFlash® -Flash method thermal conductivity meter (RT... 1250 ° C)

Creating a Xintiandi for Measuring Thermal Diffusion Coefficient and Thermal Conductivity -- Fast, Simple and Economical





Instrument Introduction Technical Specifications ZoomOptics Application Examples


Accurate testing of thermal diffusivity and thermal conductivity, covering a wide temperature range of RT... 1250 ° C

Nike's new flash thermal conductivity meter LFA 467 HyperFlash® Based on mature LFA 467 HyperFlash® Platform construction, can be done at room temperature Accurate measurement of thermal diffusivity and thermal conductivity between 1250 ° C. The instrument uses an innovative xenon lamp light source system, which has a long light source life and provides accurate thermal conductivity measurement over a wide temperature range, with almost no consumables.

ZoomOptics -Optimize the detection range to obtain accurate measurement results

Patent ZoomOptics The system (patent number: DE 10 2012 106 955 B4 2014.04.03) optimizes the detection range of the detector, eliminates interference signals at the outer edge of the sample, and greatly improves the accuracy of measurement results.

Ultra high data acquisition rate (up to 2MHz), extremely narrow light pulse width (minimum below 20 μ s), allowing measurement of thin and highly thermally conductive materials

LFA 467 HyperFlash® The data acquisition rate of the series products has been increased to 2 MHz. This ultra-high data acquisition rate is reflected in both the infrared detector and the pulse mapping channel. Thus, it is possible to effectively test high thermal conductivity thin layer materials with very short heat transfer times, such as metal sheets with a thickness of about 0.3mm or polymer films with a thickness of about 30 μ m.

The pulse mapping system of the patent incorporates finite pulse width effects and thermal losses into the calculation (Patent No.: US7038209 B2; US; DE1024241)。


Vacuum sealed to ensure a pure atmosphere and prevent sample oxidation

The instrument is equipped with a fully automatic vacuum system, which can automatically evacuate and replace the atmosphere before the measurement begins, ensuring the purity of the atmosphere. The instrument also has an extended vacuum interface that can be connected to an external vacuum pump. The platinum furnace is designed for vacuum sealing, with a maximum heating rate of 50K/min.

By designing four different grades and four independent thermocouples, the efficiency and accuracy of sample measurement and temperature measurement are improved

The instrument achieves efficient testing over a wide temperature range through an automatic sampler (ASC). ASC contains four sample grades and can load circular samples with a diameter of 12.7mm, or circular or square samples with a size of 10mm. Each sample grade has an independent thermocouple. This design greatly reduces the temperature deviation between the sample and the temperature measurement point.

Compact in size and highly integrated

LFA 467 HT HyperFlash® It is the first LFA system based on xenon lamp light source that can reach a high temperature of 1250 ° C. The instrument is equipped with a single furnace body and a built-in automatic sampler to maintain LFA 467 HyperFlash® Consistently compact in size, it covers a wide temperature range. Even at higher temperatures, an effective internal circulation water cooling system can still ensure that the temperature of surrounding components is within a safe range, thereby reducing the liquid nitrogen consumption of infrared detectors.

LFA 467 HT HyperFlash® -Technical parameters

  • Temperature range: RT...>1250 ° C, single furnace body
  • Maximum heating rate: 50 K/min
  • Infrared detector: InSb (RT...>1250 ° C, can be equipped with liquid nitrogen automatic filling equipment)
  • Data acquisition rate: maximum 2 MHz (applicable to both infrared detectors and pulse mapping channels)
  • Range of thermal diffusion coefficient: 0.01 mm2/s . .. 2000 mm2/s
  • Thermal conductivity:<0.1='' w/(m * k)=''...='' 4000='' w/(m * k)=''>
  • Patented pulse mapping technology: used for finite pulse correction and improving the accuracy of specific heat measurement
  • Atmosphere: Inert, Oxidative, Static and Dynamic
  • Vacuum: 10-4 mbar
  • Sample holder: suitable for circular and square samples
  • Atmosphere control: MFC and AutoVac

LFA 467 HT HyperFlash® structural diagram
Use a flash source to heat the lower surface of the sample, and use an infrared detector to detect the temperature rise process on the upper surface of the sample