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    Room 322, Building A, Lane 168, Chengnan Road, Huinan Town, Pudong New Area, Shanghai

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Laser Thermal Conductivity Analyzer LFA 457 M

NegotiableUpdate on 02/12
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Overview

Laser thermal conductivity meter LFA457MicroFlash ® NETZSCHLFA457MicroFlash ® Represents the latest progress in contemporary laser flash measurement technology

Product Details

Laser Thermal Conductivity Analyzer LFA 457 MicroFlash®

NETZSCH LFA 457 MicroFlash® This represents the latest progress in contemporary laser flash measurement technology. The instrument is desktop type, with a temperature range of -125 ... 1100 ° C. In order to cover this temperature range, two freely switchable furnace bodies are provided.

The new infrared sensor technology used in the system allows users to measure the temperature rise curve of the back of the sample even at a low temperature of -125 ° C.

The instrument can measure multiple smaller samples in one heating process using the built-in automatic sample switcher, or measure larger samples separately (with a maximum diameter of 25.4mm).

The vacuum sealed system allows the instrument to measure in a variety of user selectable atmospheres.

The vertical arrangement of the sample holder, furnace body, and detector facilitates the placement and replacement of samples, while also providing the best signal-to-noise ratio for the detection signal.

LFA 457 is the most powerful and flexible LFA system, suitable for characterizing conventional materials and new high-performance materials in various fields including automotive manufacturing, aerospace, and energy technology.


LFA 457 MicroFlash® -Technical parameters

  • Temperature range: -125 500 ° C, RT... 1100 ° C (using two freely replaceable furnace bodies)
  • Heating and cooling rate: 0.01 .. 50 K/min
  • Laser energy: 18.5 J/pulse (power adjustable)
  • Non contact surface temperature rise signal testing of samples using infrared detectors
  • Range of thermal diffusion coefficient: 0.01 .. 1000 mm2/s
  • Thermal conductivity range: 0.1 .. 2000 W/m*K
  • Sample diameter: 10 25.4mm circle, or 8 × 8 and 10 × 10mm square.
  • Sample thickness: 0.1 .. 6 mm
  • Sample holder: Silicon carbide, graphite
  • Molten metal container: Sapphire
  • Liquid sample container: Platinum
  • Atmosphere: Inert, Oxidation, Reduction, Static, Dynamic
  • Vacuum sealed system: Vacuum degree 10-2 mbar(1 Pa)

LFA 457 MicroFlash® Structural schematic diagram (1100 ° C furnace body)