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Room 322, Building A, Lane 168, Chengnan Road, Huinan Town, Pudong New Area, Shanghai
Shanghai Hengze Technology Co., Ltd
Room 322, Building A, Lane 168, Chengnan Road, Huinan Town, Pudong New Area, Shanghai
NETZSCH LFA 457 MicroFlash® This represents the latest progress in contemporary laser flash measurement technology. The instrument is desktop type, with a temperature range of -125 ... 1100 ° C. In order to cover this temperature range, two freely switchable furnace bodies are provided.
The new infrared sensor technology used in the system allows users to measure the temperature rise curve of the back of the sample even at a low temperature of -125 ° C.
The instrument can measure multiple smaller samples in one heating process using the built-in automatic sample switcher, or measure larger samples separately (with a maximum diameter of 25.4mm).
The vacuum sealed system allows the instrument to measure in a variety of user selectable atmospheres.
The vertical arrangement of the sample holder, furnace body, and detector facilitates the placement and replacement of samples, while also providing the best signal-to-noise ratio for the detection signal.
LFA 457 is the most powerful and flexible LFA system, suitable for characterizing conventional materials and new high-performance materials in various fields including automotive manufacturing, aerospace, and energy technology.
LFA 457 MicroFlash® Structural schematic diagram (1100 ° C furnace body) |