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E-mail
xy@shyrjc.com
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Phone
18621740419
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Address
Baolong Plaza Phase II, Jinhai Road, Caolu Town, Pudong New Area, Shanghai
Shanghai Yuanren Testing Equipment Co., Ltd
xy@shyrjc.com
18621740419
Baolong Plaza Phase II, Jinhai Road, Caolu Town, Pudong New Area, Shanghai
1、 Instrument Introduction
The YJ-230 transmission reflection metallographic microscope adopts excellent optical system and modular functional design concept. After upgrading the system, it can achieve functions such as polarization observation and bright field observation. The compact and stable integrated main body design fully embodies the requirements of microscope operation stability. The idealized design of the instrument makes operation more convenient and space more extensive. Suitable for metallographic structure analysis and microscopic observation of surface morphology, it is an ideal instrument for research in metallurgy, mineralogy, and polymer materials science. Suitable for observing transparent and opaque substances in various electronic processing and casting industries, such as metals, ceramics, integrated blocks, printed circuit boards, liquid crystal panels, films, fibers, coatings, and other materials. It is also suitable for observation and analysis in agriculture, forestry, animal husbandry, fishery, and scientific research departments.
Performance characteristics
▲ Equipped with a large field eyepiece and a long working distance flat field achromatic objective lens (without cover glass), the field of view is large and clear.
Coaxial focusing coarse fine adjustment mechanism, with adjustable coarse focusing elasticity, equipped with limit and locking devices, fine adjustment grid value: 2 μ m.
▲ Configure reflection and transmission lighting systems to perform microscopic imaging observation on opaque or transparent objects.
▲ Halogen lamp (6V, 20W), adjustable brightness.
▲ Three eye observation tube, capable of freely switching between polarized observation and normal observation, capable of 100% transparent photography.
2、 Parameter configuration
Instrument configuration | |||
Model number |
YJ-230 |
DYJ-230A |
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Eyepiece |
Large field of view WF10X (field of view diameter Φ 18mm) |
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Objective lens (uncovered glass slide) |
Long distance flat field achromatic objective PL 5X/0.12 |
Long distance flat field achromatic objective PL 5X/0.12 |
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Long distance flat field achromatic objective PL L10X/0.25 |
Long distance flat field achromatic objective PL L10X/0.25 |
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Long distance flat field achromatic objective PL L40X/0.60 |
Long distance flat field achromatic objective PL L40X/0.60 |
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Long distance flat field achromatic objective PL L60X/0.75 (spring) |
Long distance flat field achromatic objective PL L60X/0.75 (spring) |
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Long distance flat field achromatic objective PL L 100X/0.85 (spring) |
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stage |
Double layer mechanical mobile type (size: 185mmX140mm, range of movement: 75mmX50mm) |
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converter |
Four holes (inward ball positioning) |
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Transmission lighting system |
6V20W halogen lamp, adjustable brightness |
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Abbe spotlight NA.1.25 can be raised and lowered up and down | |||
Equipped with frosted glass and blue filter | |||
eyepiece tube |
Triple eyepiece, tilted at 30 degrees, (with built-in polarizer, switchable) |
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Focuser |
Coarse micro coaxial focusing, micro grid value: 2 μ m, adjustable coarse tension, with locking and limiting devices |
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anti-mold |
Unique anti mold system |
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Select accessories |
objective |
Long distance flat field achromatic objective PL L 50X/0.70 |
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Long distance flat field achromatic objective PL L 80X/0.80 | |||
eyepiece |
Wide field of view WF16X (Φ 11mm) |
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Divide into 10X (Φ 18mm) grids with a value of 0.1mm per grid | |||
software |
Specialized software for grading and analyzing metallographic structure diagrams |
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Metallographic image measurement and analysis software | |||
Computer Type |
1. Metallographic microscope 2. Adaptor 3. Camera (CMOS) 4. Computer (optional) |
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Digital |
1. Metallographic microscope 2. Adaptor lens 3. Digital camera (optional) |
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