Taisi Ken MAGNA new generation ultra-high resolution field emission scanning electron microscope

Product Introduction:

TESCAN MAGNAIt is an extremely powerful analytical instrument suitable for morphological characterization and microscopic analysis of nanomaterials.MAGNAto configureTriglav ™typeSEMTube, with ultra-high resolution, particularly evident at low voltages; The detector system inside the tube has the ability to filter electronic signals, which can obtain better image contrast and surface sensitivity. It is very suitable for imaging non-conductive samples, such as ceramics, uncoated biological samples, and semiconductor photosensitive samples.

Product Features

• Unique real-time electron beam tracking technology(In-flight Beam Tracing ™)Function, can set and optimize beam spot size and beam intensity.
• distinctiveTriBE^TMandTriSE^TMIn-BeamDetector system for achieving more advanced nanoscale characterization.
• TESCAN Essence ™Convenient electron microscope operation software.
• Can be configuredTESCANMultiple extended analysis attachments, whether self owned or third-party, such asEDS、EBSD、CL、RamanCombined use.