Probe Scanning Atomic Force Microscope FM Nanoview LS-AFM

◆A commercial atomic force microscope that allows the sample to remain stationary while the probe moves for scanning;

◆The sample size and weight are almost unlimited, making it particularly suitable for testing oversized samples;

The sample stage has strong expandability and is very convenient for multi instrument linkageImplement in-situ detection;

◆Electric control sample moving table and lifting table, programmable multi-point position for fast and automated detection;

◆Longmen style scanning head design, marble base, vacuum adsorption and magnetic adsorption stage;
◆Intelligent needle insertion method for automatic detection of pressurized ceramic by motor control, protecting probes and samples;
◆High magnification assisted optical microscopy positioning, real-time observation and positioning of probes and sample scanning areas;

◆Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%

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